This e-Seminar focuses on making efficient use of the wealth of patent classification systems available in STN patent databases, including the Derwent World Patent Index (DWPI), CAplus and INPAFAMDB. Learn how to refine or expand your STN search strategies for optimum results, using International (IPC), European (ECLA), U.S. (NCL) and Japanese (FI, F-Term) classification systems. This session will be of interest to novice, intermediate and expert classification searchers.